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  2. Transistor tester - Wikipedia

    en.wikipedia.org/wiki/Transistor_tester

    Transistor testers have the necessary controls and switches for making the proper voltage, current and signal settings. A meter with a calibrated "good" and "bad" scale is on the front. In addition, these transistor testers are designed to check the solid-state diodes. There are also testers for checking high transistor and rectifiers .

  3. Transistor - Wikipedia

    en.wikipedia.org/wiki/Transistor

    A transistor is a semiconductor device used to amplify or switch electrical signals and power. It is one of the basic building blocks of modern electronics. [ 1] It is composed of semiconductor material, usually with at least three terminals for connection to an electronic circuit.

  4. Curve tracer - Wikipedia

    en.wikipedia.org/wiki/Curve_tracer

    In addition to the transistor characteristic curves, the Type 575 is used to display dynamic characteristics of a wide range of semiconductor devices." (Tektronix, Catalog, 1967) A curve tracer is a specialised piece of electronic test equipment used to analyze the characteristics of discrete electronic components , such as diodes , transistors ...

  5. Negative-bias temperature instability - Wikipedia

    en.wikipedia.org/wiki/Negative-bias_temperature...

    Negative-bias temperature instability. Negative-bias temperature instability ( NBTI) is a key reliability issue in MOSFETs, a type of transistor aging. NBTI manifests as an increase in the threshold voltage and consequent decrease in drain current and transconductance of a MOSFET. The degradation is often approximated by a power-law dependence ...

  6. MOSFET - Wikipedia

    en.wikipedia.org/wiki/MOSFET

    In electronics, the metal–oxide–semiconductor field-effect transistor ( MOSFET, MOS-FET, or MOS FET) is a type of field-effect transistor (FET), most commonly fabricated by the controlled oxidation of silicon. It has an insulated gate, the voltage of which determines the conductivity of the device.

  7. High-temperature operating life - Wikipedia

    en.wikipedia.org/wiki/High-temperature_operating...

    High-temperature operating life. High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time. The IC is usually monitored under stress and tested ...

  8. Field-effect transistor - Wikipedia

    en.wikipedia.org/wiki/Field-effect_transistor

    The field-effect transistor ( FET) is a type of transistor that uses an electric field to control the flow of current in a semiconductor. It comes in two types: junction FET (JFET) and metal-oxide-semiconductor FET (MOSFET). FETs have three terminals: source, gate, and drain. FETs control the flow of current by the application of a voltage to ...

  9. Leakage (electronics) - Wikipedia

    en.wikipedia.org/wiki/Leakage_(electronics)

    In semiconductor devices, leakage is a quantum phenomenon where mobile charge carriers (electrons or holes) tunnel through an insulating region. Leakage increases exponentially as the thickness of the insulating region decreases. Tunneling leakage can also occur across semiconductor junctions between heavily doped P-type and N-type semiconductors.

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