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A transient-voltage-suppression diode can respond to over-voltages faster than other common over-voltage protection components such as varistors or gas discharge tubes. The actual clamping occurs in roughly one picosecond, but in a practical circuit the inductance of the wires leading to the device imposes a higher limit.
Another type of tunnel diode is a metal-insulator-insulator-metal (MIIM) diode, where an additional insulator layer allows "step tunneling" for more precise control of the diode. [11] There is also a metal-insulator-metal (MIM) diode, but due to inherent sensitivities, its present application appears to be limited to research environments. [12]
Tunable diode laser absorption spectroscopy. Tunable diode laser absorption spectroscopy ( TDLAS, sometimes referred to as TDLS, TLS or TLAS [1]) is a technique for measuring the concentration of certain species such as methane, water vapor and many more, in a gaseous mixture using tunable diode lasers and laser absorption spectrometry.
High-temperature operating life. High-temperature operating life (HTOL) is a reliability test applied to integrated circuits (ICs) to determine their intrinsic reliability. This test stresses the IC at an elevated temperature, high voltage and dynamic operation for a predefined period of time. The IC is usually monitored under stress and tested ...
IEC 61000-4-5 defines test set-up, procedures, and classification levels. In particular, it standardizes the required surge voltage and current waveforms for laboratory testing, with the "1.2/50-8/20 μs" impulse being the most frequently used surge waveform. Although this standard is designed for testing equipment as a whole at system level ...
The Shockley diode equation relates the diode current of a p-n junction diode to the diode voltage .This relationship is the diode I-V characteristic: = (), where is the saturation current or scale current of the diode (the magnitude of the current that flows for negative in excess of a few , typically 10 −12 A).
Electron-beam-induced current (EBIC) is a semiconductor analysis technique performed in a scanning electron microscope (SEM) or scanning transmission electron microscope (STEM). It is most commonly used to identify buried junctions or defects in semiconductors, or to examine minority carrier properties. EBIC is similar to cathodoluminescence in ...
Small-signal model. Small-signal modeling is a common analysis technique in electronics engineering used to approximate the behavior of electronic circuits containing nonlinear devices with linear equations. It is applicable to electronic circuits in which the AC signals (i.e., the time-varying currents and voltages in the circuit) are small ...
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